Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9812699 | Thin Solid Films | 2005 | 5 Pages |
Abstract
The present study reports for the first time NCD coating of Si3N4 substrates by microwave plasma-assisted chemical vapour deposition (MPACVD) using Ar/H2/CH4 gas mixture and varying the substrate temperature (650-1050 °C) and deposition time. Optimal deposition conditions result in growth rates up to 3.0 μm hâ1 that allowed the production of continuous NCD films with low roughness (Raâ22 nm) and grain size of about 10 nm at the lower temperatures and longer deposition times.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
M. Amaral, F. Mohasseb, F.J. Oliveira, F. Bénédic, R.F. Silva, A. Gicquel,