| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9812712 | Thin Solid Films | 2005 | 6 Pages |
Abstract
Near-edge X-ray absorption fine structure (NEXAFS) and Raman spectroscopy evidenced the aromatic ring formation and the clustering condensation process with increasing surface temperature. The surface roughness and morphology of films grown at different conditions have been characterised by atomic force microscopy (AFM) and scanning electron microscopy (SEM).
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Authors
E. Cappelli, C. Scilletta, S. Orlando, R. Flammini, S. Iacobucci, P. Ascarelli,