| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9812791 | Thin Solid Films | 2005 | 4 Pages |
Abstract
The phase changes of NiMn films, produced by co-sputtering from elemental targets on glass slides, were investigated using differential scanning calorimetry (DSC) and X-ray diffraction (XRD). The as-deposited NiMn thin films were found to be amorphous or nanocrystalline with a high defect density. When subjected to thermal annealing, the films exhibit four exothermic reactions as measured by DSC. The second and the third peaks were attributed to the formation of the fcc (A1) phase and the face-centered tetragonal (L10) phase, respectively. The first peak around 160 °C and last one at 440 °C could be due to oxidation and coarsening, respectively.
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Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Mianliang Huang, Peter F. Ladwig, Y. Austin Chang,