Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9812896 | Thin Solid Films | 2005 | 4 Pages |
Abstract
Fluorinated amorphous carbon films were deposited on a p-type silicon substrate by using an inductively coupled plasma chemical vapor deposition with mixture of carbon tetrafluoride and methane gases. The structural properties of fluorinated amorphous carbon films as a diamond-like carbon were studied by Raman spectra, Fourier transform infrared spectra (FTIR) and X-ray photoelectron spectroscopy (XPS) spectra as a function of the flow rate ratio of precursors. The variation of the fluorine contents of fluorinated amorphous carbon films was investigated by X-ray photoelectron spectroscopy. From these chemical results, the correlation between the dielectric constant and the variation of the bonding structure as a function of the flow rate ratio was researched.
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Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Teresa Oh, Chi Kyu Choi, Kwang-Man Lee,