Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9812950 | Thin Solid Films | 2005 | 5 Pages |
Abstract
Plasma polymerized N,N,3,5-tetramethylaniline (PPTMA) thin films were deposited on to glass substrates at room temperature by a capacitively coupled parallel plate reactor. The as-grown and heat-treated thin films of about 400 nm thick were characterized by infrared (IR) and ultraviolet-visible (UV-Vis) spectrometry. The structural analyses reveal that PPTMA thin films are formed with certain amount of conjugation, which modifies on heat treatment. From the UV-Vis absorption spectra, allowed direct transition (Eqd) and indirect transition (Eqi) energy gaps are determined to be 2.80 and 1.56 eV, respectively. While Eqd increases a little, Eqi decreases, on heat treatment of PPTMA. The calculated values of B for all the samples indicate an increase in structural order/conjugation in PPTMA thin films on heat treatment.
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Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
H. Akther, A.H. Bhuiyan,