| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9812982 | Thin Solid Films | 2005 | 5 Pages |
Abstract
Photoluminescence (PL) emissions from localized trap states in crystalline thin films of quaterthiophene (4T) were investigated. The analysis of the PL spectra as a function of temperature allows to characterize the main trap states involved in the light emission, obtaining their activation energy. From comparison with the data reported for other oligothiophenes (OT) with different number of conjugated rings, a general scheme for the trap-related energy levels is proposed.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Michele Cerminara, Francesco Meinardi, Alessandro Borghesi, Adele Sassella, Riccardo Tubino,