Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9813017 | Thin Solid Films | 2005 | 5 Pages |
Abstract
CuxS thin films were deposited on indium-tin-oxide-coated glass substrates by photochemical deposition from an aqueous solution of CuSO4 and Na2S2O3. Thin films of different compositions of CuxS were deposited in acidic medium (pH â¼3.0) for the duration of 1-2 h photoirradiation. The thickness of the films was measured in the range of 0.15-0.35 μm. The as-deposited films were characterized by Auger electron spectroscopy (AES), X-ray diffraction (XRD), Raman spectroscopy and optical transmission spectroscopy. AES analysis showed a continuous copper-sulfur ratio x from 2.3 to 1.3 depending on the solution composition. Raman peaks were measured at about 475 cmâ1. XRD studies showed polycrystallinity of the CuxS thin films. The optical spectra of CuxS films exhibit high transmission in the visible region and absorption throughout the near-infrared region (800-1500 nm). The energy band gap of CuxS films was estimated in the range of 2.15-2.53 eV.
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Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Jiban Podder, Ryohei Kobayashi, Masaya Ichimura,