MFM studies of microstructure and magnetic properties of iron thin films prepared by sputtering

We have studied the microstructure and magnetic domain structure of thin Fe film by magnetic force microscopy (MFM). Due to the high lateral resolution of MFM we have been able to study the magnetic structure of a single domain. Two series of iron thin films have been grown on microcrystalline glass substrate by DC magnetron sputtering. They were prepared at different Ar pressures and annealing time. The results by MFM show characters of both surface morphology of the films and their local magnetic properties. It is suggested that the pin effect by single domain wall influences magnetic properties of the iron thin films.