| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9816889 | Ultramicroscopy | 2005 | 13 Pages |
Abstract
The theoretical framework for the computation of electromagnetic fields and electron optical phase-shifts in Fourier space has been recently applied to objects with long-range fringing fields, such as reverse-biased p-n junctions and magnetic stripe domains near a specimen edge. In addition to new analytical results, in this work, we present a critical comparison between numerical and analytical computations. The influence of explicit and implicit boundary conditions on the phase shifts and phase-contrast images is also investigated in detail.
Keywords
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Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
P.F. Fazzini, G. Pozzi, M. Beleggia,