| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9817440 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2005 | 4 Pages |
Abstract
There is high demand for materials characterization on the nanometer length scale using hard X-ray techniques at third-generation X-ray synchrotron sources. For this reason, there are intense efforts underway for improving the quality and design of the X-ray optics that deliver these nano-focused X-ray beams. The proposed NSLS-II ultra-low emittance 3 GeV electron storage ring will provide the necessary brightness to deliver 10 nm spatial-resolution to a variety of dedicated nanoprobe beamlines at this facility. In this paper, we explore how this resolution can be attained using several types of X-ray optics, and also how their performance would compare at the present NSLS second-generation X-ray source.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
James M. Ablett,