Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9817464 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2005 | 5 Pages |
Abstract
A new generation of secondary neutral mass spectrometry (SNMS) instruments has been developed that is especially designed for laser post-ionization (LPI). These instruments combine high useful yield and high background discrimination. Results presented here demonstrate that these instruments can detect one in every four atoms removed from a samples surface - a greater than one order of magnitude improvement over current large frame secondary ion mass spectrometry instruments. Because of their high sensitivity, these new LPI-SNMS instruments are especially amenable to analysis of samples of limited size and rare one-of-a-kind samples. Such an application is analysis of samples returned to Earth from space by the Genesis and Stardust Discovery missions of NASA.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Igor V. Veryovkin, Wallis F. Calaway, C. Emil Tripa, Jerry F. Moore, Andreas Wucher, Michael J. Pellin,