| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9817563 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2005 | 7 Pages |
Abstract
The present state and recent developments of the PIXE method are presented. Fields of application, improvements of the instrumentation and the new installations are reviewed. The bases of physical parameters needed for data evaluation are discussed. The progress in numerical methods is shown, especially on the methods for the in-depth analysis and the evaluation of concentration profiles.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Ž. Šmit,