| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9817593 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2005 | 5 Pages |
Abstract
Pd diffusion in Rh has a great interest in the 103Pd* production intended to brachytherapy, a cancer treatment using radioactive implants. In order to study that diffusion, DC-magnetron sandwich layers of natural Pd and Rh were produced, annealed, and the Pd profiles were measured by ToF-SIMS. Nevertheless, because ToF-SIMS depth profiles suffer from a lack of quantification and depth calibration, the study was completed by RBS, PIXE. The combination of these techniques allowed us to convert the ToF-SIMS depth profiles from an intensity-time to a concentration-depth profile and thus to study the Pd diffusion in Rh.
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Authors
R.L. Hubert, J. Brison, L. Houssiau, S. Lucas,