Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9817651 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2005 | 5 Pages |
Abstract
The feasibility of high-resolution strain mapping in bulk samples with both high-spatial and strain resolution is demonstrated using high-energy X-rays between 100 and 300Â keV on beam line ID15A at the ESRF. This was achieved by using a multiple-peak Pawley-type refinement on the recorded spectra. An asymmetric peak profile was necessary in order to obtain a point-to-point strain uncertainty of 10â5. The presented results have been validated with alternative methods, in this case FE model predictions. This technique promises to be a significant development in the in situ characterisation of strain fields around cracks in bulk engineering samples. The implication of slit size and grain size are discussed. This paper is a concise version of the work published in [A. Steuwer, J.R. Santisteban, M. Turski, P.J. Withers, T. Buslaps, J. Appl. Cryst. 37 (2004) 883].
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
A. Steuwer, J.R. Santisteban, M. Turski, P.J. Withers, T. Buslaps,