| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9817653 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2005 | 5 Pages |
Abstract
Synchrotron X-ray methods are particularly well suited to the investigation of residual stresses in the near-surface regions of engineered components. High intensity and low divergence allows small gauge volumes to be defined in order to study stress fields existing over a range of several hundred microns. It is however necessary to develop techniques to overcome the elongation of the gauge volume resulting from high energy X-rays. It is shown that high resolution residual stress information can be obtained from a surface treated specimen in both the normal and in-plane directions.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
D.J. Hughes, Z. Chen,