| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9817680 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2005 | 6 Pages |
Abstract
A detailed study of EXAFS data has been used to evaluate the microstructural properties of grains forming the sample. A new model is proposed to determine the average dimensions of nanometric thin film iron grains, considering them as elongated particles, and taking into account polarization of the incident X-ray. Results show a clear decrease of grain size as the preparation temperature diminishes, and they are in very good agreement with previous measurements determined by X-ray diffraction techniques.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
F. Jiménez-Villacorta, A. Muñoz-MartÃn, C. Prieto,