| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9817682 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2005 | 4 Pages |
Abstract
High-resolution measurements of the resonant X-ray Raman scattering (RRS) of Al and Si and their oxides were performed at the European Synchrotron Radiation Facility (ESRF) in Grenoble, France, using a von Hamos Bragg-type curved crystal spectrometer. To probe the influence of chemical effects on the RRS X-ray spectra, Al2O3 and SiO2 samples were also investigated. The X-ray RRS spectra were measured at different photon beam energies tuned below the K-absorption edge. The measured spectra are compared to results of RRS calculations based on the second-order perturbation theory within the Kramers-Heisenberg approach.
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Authors
J. Szlachetko, M. Berset, J.-Cl. Dousse, K. Fennane, M. Szlachetko, R. Barrett, J. Hoszowska, A. Kubala-Kukus, M. Pajek,