| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9817862 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2005 | 6 Pages |
Abstract
The VUV-photodegradation of polytetrafluoroethylene (PTFE) ultra-thin film was studied by ultraviolet photoelectron spectroscopy and quadrupole mass spectrometry. These results were compared with the previous photodegradation studies of the polyvinylidenefluoride (PVDF) and polyethylene (PE). Generation of new peak, Ï-band originated from the CC bond, was observed in the low binding energy region of the UPS spectra in both PVDF and PE during the photodegradation. In contrast, no new peak generation was observed in the UPS of the photodegraded PTFE. Mass spectrometry analysis also suggested that the CC bond generation is not a major mechanism in the VUV photodegradation of PTFE.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Masaki Ono, Hiroyuki Yamane, Hirohiko Fukagawa, Satoshi Kera, Daisuke Yoshimura, Koji K. Okudaira, Eizi Morikawa, Kazuhiko Seki, Nobuo Ueno,