Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9817933 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2005 | 5 Pages |
Abstract
We report on the introduction of Ge(CH3)4 into the Dresden EBIS, a further development of the Dresden EBIT. Energy-dispersive X-ray spectra from highly charged germanium ions are measured with a Si(Li)-detector at different source operation conditions, such as electron currents ranging from 50Â mA to 200Â mA at electron energies of up to 20Â keV. Direct excitation processes in Ge30+ at 18Â keV electron energy have been analyzed as well as radiative electron capture into Ge28+ up to Ge31+ ions. Furthermore satellite lines from dielectronic recombination processes in Ge28+ to Ge30+ ions have been measured.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
G. Zschornack, S. Landgraf, F. Grossmann, U. Kentsch, V.P. Ovsyannikov, M. Schmidt, F. Ullmann,