| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9817946 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2005 | 5 Pages |
Abstract
Enhanced confinement regimes with steep gradients of density profiles and the need to place rotation velocity profiles call for maximum spatial resolution in the tokamak plasma. It is proposed to achieve such a resolution by using X-ray spectroscopy with double reflections in single crystals.
Keywords
Related Topics
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Materials Science
Surfaces, Coatings and Films
Authors
B.S. Fraenkel, Z.H. Kalman, M. Bitter, J. Rice, A. Ince-Cushman,