| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9817954 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2005 | 4 Pages |
Abstract
Decay dynamics of dielectronic recombination (DR) processes of H-like titanium ions was investigated with an electron beam ion trap. In the DR of H-like ions a K-shell vacancy is available even after the decay of the doubly excited state produced by the recombination. Therefore secondary X-ray emission is possible. An observed X-ray spectrum of DR obtained in the present experiment was well reproduced theoretically by taking into account the secondary X-rays.
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Authors
H. Watanabe, A.P. Kavanagh, H. Kuramoto, Y.M. Li, N. Nakamura, S. Ohtani, B.E. O'Rourke, A. Sato, H. Tawara, X.M. Tong, F.J. Currell,