Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9817988 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2005 | 5 Pages |
Abstract
Time and two-dimensional position distributions of F+ ions emitted from a well-defined F/Si(1 0 0)-2 Ã 1 target were measured for impact of slow highly charged ions of 3.9 keV Ar5+. The time and position distributions were transformed into energy and angular distributions, which revealed that the peak emission energy was 2.0 ± 0.6 eV and the emission angle measured from the surface normal was 18 ± 4° in the (0 1 1) or (011¯) plane.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
N. Okabayashi, K. Komaki, Y. Yamazaki,