| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9817991 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2005 | 4 Pages |
Abstract
We have observed highly oriented pyrolytic graphite (HOPG) irradiated with highly charged ions (HCIs) with a scanning probe microscope. The same impact site was observed with both the scanning tunnelling microscope (STM) and atomic force microscope (AFM) modes. In the non-contact mode AFM image, protrusion-like dots have been observed as well as in the STM observations. The dot size (diameter) and height observed with the AFM mode were nearly equal to that with the STM mode. The present observation clearly indicates that an HCI impact induces topographic modification on an HOPG surface.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Masashi Terada, Nobuyuki Nakamura, Yoichi Nakai, Yasuyuki Kanai, Shunsuke Ohtani, Ken-ichiro Komaki, Yasunori Yamazaki,