Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9817994 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2005 | 5 Pages |
Abstract
K X-rays emitted from 2.1 keV/u N ions transmitted through a thin Ni microcapillary foil were measured in coincidence with a final charge state qf, using a Si(Li) X-ray detector in the cases of incident charge states of qi = 7 and 6. It was found that (1) the coincidence X-ray yield for (qi, qf) = (7, 6) decreased faster than those for other (qi, qf) combinations, (2) the coincidence X-ray yields did not depend on the number of K-shell holes of the incident ions but on the final charge state qf.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Y. Iwai, Y. Kanai, Y. Nakai, T. Ikeda, M. Hoshino, H. Oyama, K. Ando, H. Masuda, K. Nishio, H.A. Torii, K. Komaki, Y. Yamazaki,