Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9818102 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2005 | 6 Pages |
Abstract
The influence of the ion bombardment on the surface properties of water-ice films has been investigated. The films are irradiated with 1.5 keV He+ ions and analyzed sequentially on the basis of time-of-flight secondary-ion mass spectrometry (TOF-SIMS). In order to minimize any temperature-induced effects, the measurements were made at 15 K. The damage of the films, as estimated from the H/D exchange between NH3 and the D2O ice and the intermixing of NH3 with the H218O ice, is recognized at the fluence above 2 Ã 1014 ions/cm2. The sputtering yield of the D2O ice is determined as 0.9 ± 0.2 molecules per incoming He+ ion. The temperature-programmed TOF-SIMS analysis of the water-ice films has been completed within the fluence of 5.8 Ã 1012 ions/cm2, so that no appreciable damage of the film should be induced during the measurement.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
M. Kondo, T. Shibata, H. Kawanowa, Y. Gotoh, R. Souda,