Article ID Journal Published Year Pages File Type
9818120 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2005 7 Pages PDF
Abstract
Three-dimensional momentum of sputtered ions were measured in coincidence with scattered Ar atoms in collisions between Arq+ (q = 3, 8, 11, and 14) and 6H-SiC and GaN surfaces at grazing-incidence angle (<0.5°). H+, H2+, Si+ and Ga+ ions were observed in time-of-flight-mass spectra. Sputtering yields of H+ and H2+ increased with increasing charge states of incident ions in proportion to q4. The momenta of these secondary ions emitted from the surfaces were intensively distributed to the direction of surface normal in spite of the grazing collisions. Almost no significant change among different q was found in the kinetic energy distributions of these secondary ions.
Related Topics
Physical Sciences and Engineering Materials Science Surfaces, Coatings and Films
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