Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9818130 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2005 | 5 Pages |
Abstract
We developed a reliable method of transferring specimens at low temperature after ion irradiation with a cryostat for X-ray diffraction measurements. Single crystal Ni specimens have been irradiated with heavy ions at 13Â K. Transferring the irradiated specimens at low temperature without any warming up, defect structures were studied using X-ray diffuse scattering on annealing between 18Â K and room temperature. We observed a qâ4-dependence of the diffuse scattering intensity after the irradiation and the results indicated that there were both vacancies and interstitial clusters, which were associated with a displacement cascade. With increasing the annealing temperature of the irradiated Ni, the interstitial dislocation loops grew at 200Â K and the radius and number of those loops began to decrease below 300Â K.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
H. Maeta, N. Matsumoto, T. Kato, H. Sugai, H. Ohtsuka, M. Sataka,