Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9818152 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2005 | 5 Pages |
Abstract
At HVE, we investigated the influence of the small angle scattering on the beam brightness. Various ion optical approaches were compared and it was concluded that a multicusp ion source provides the possibility to minimise the degradation in the beam brightness due to small angle scattering of the ions. It is expected that a beam brightness of 10-50 A mâ2 radâ2 eVâ1 can be achieved with the Tandetron⢠accelerator systems.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
J. Visser, D.J.W. Mous, A. Gottdang, R.G. Haitsma,