| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9818172 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2005 | 6 Pages |
Abstract
An off-line true elemental mapping procedure has been implemented at the Debrecen scanning nuclear microprobe facility for particle induced X-ray emission (μPIXE) measurements. The principles of the dynamic analysis model introduced by Ryan and Jamieson were adapted and extended towards the direction of the analysis of any thickness and large area samples. For the calculations the PIXEKLM program package was upgraded and a new windows-platform program (True PIXE Imaging) developed. Elemental concentration maps can be created from Oxford-type list mode files for major and trace elements from carbon to uranium.
Keywords
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Surfaces, Coatings and Films
Authors
I. Uzonyi, Gy. Szabó,