| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9818227 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2005 | 5 Pages |
Abstract
We have shown in these experiments that it is possible to distinguish between electron and hole traps by doing the excitation in the vicinity of the appropriate electrode. In conjunction with the ion beam induced charge (IBIC) and time-resolved IBIC (TRIBIC) technique such experiments can be used to characterize semiconductor materials in a more detailed way.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Z. MeduniÄ, Ž. PastuoviÄ, M. JakÅ¡iÄ, N. Skukan,