Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9818291 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2005 | 7 Pages |
Abstract
In the present work, 120Â keV N-ion doped and 30Â MeV C60 ion irradiated graphite-like-carbon samples were characterized by RBS, micro-FTIR, micro-Raman, XPS spectroscopy and the variation of the properties of the samples with the N-dopant and/or C60 irradiation fluence have been studied. The RBS spectra showed that C60 irradiation can induce a partial diffusion of N atoms to the surface and the amount of the diffused N atoms increases slightly with increasing C60 irradiation fluence. The FTIR and Raman spectra exhibit characteristic bands of carbon nitrogen bonds showing that the C and N atoms are chemically bonded. The amount of chemically bonded C and N atoms increases with increasing N-dopant. By deconvolution of the XPS spectra, the atomic concentration of N and C atoms were obtained and it was identified that the samples mainly consist of three phases, namely, C3N4, CNx and tetrahedral amorphous carbon. The effect of N-dopant and C60 irradiation fluence on the modification of the properties of the samples is also discussed.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
Z.G. Wang, A. Dunlop, Z.M. Zhao, Y. Song, Y.F. Jin, C.H. Zhang, Y.M. Sun, J. Liu,