| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9818312 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2005 | 4 Pages |
Abstract
Here we present a TOF-LEIS setup with an energy resolution of better than 0.4% for 3Â keV He ions and report experimental results for 3Â keV He ions backscattered from a polycrystalline Cu target. The resulting ion spectrum shows interesting inherent features, which are analyzed. Possible causes for the appearance of these features are discussed.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
M. Draxler, S.N. Markin, M. KolÃbal, S. Průša, T. Å ikola, P. Bauer,