Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9818323 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2005 | 6 Pages |
Abstract
The forward and backward electron emission yields γF and γB have been calculated by Monte Carlo simulation for protons (H+) and hydrogen atoms (H0) (with energies between 25 keV and 5 MeV) incident on thin amorphous carbon foils. Direct electron excitations by the incident projectiles as well as electron excitations resulting from charge exchange processes undergone by H+ or H0 have been taken into account. For the latter, Auger and Shell processes have been considered. Subsequent electron transport has been considered in order to calculate the forward and backward electron emission yields γF and γB.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
N. Pauly, A. Dubus, M. Rösler, H. Rothard, A. Clouvas, C. Potiriadis,