Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9818324 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2005 | 5 Pages |
Abstract
The forward (γF) and backward (γB) electron emission yields have been measured for protons incident on thin carbon foils for incident energies between 2 and 7 MeV as a function of the target thickness. Comparisons with theoretical results obtained by Monte Carlo simulations are presented. In particular, the Meckbach factor Rγ = γF/γB is discussed.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
C. Potiriadis, A. Clouvas, H. Rothard, N. Pauly, A. Dubus, M. Rösler,