| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9818328 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2005 | 6 Pages |
Abstract
We have measured both secondary neutral and ionized particles from an InSb target under 3.0Â MeV Si ion bombardment. Measurements of both ions and neutrals have not been carried out so far in the MeV-energy range. The mass spectra and axial emission energy distributions of secondary particles were investigated. Secondary ions were measured with a linear- and a reflective-type time-of-flight technique, whereas secondary neutral particles were photo-ionized by a UV pulsed laser (ArF: 193Â nm) and measured with a reflective-type time-of-flight technique. Different results were obtained for neutral particles in comparison with ionized particles. The mean energy of neutral Sb atoms was much lower than that of neutral In atoms, whereas the mean energies of secondary In and Sb ions were nearly equal.
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Authors
Yoshihiko Nakata, Satoshi Ninomiya, Chikage Imada, Masafumi Nagai, Takaaki Aoki, Jiro Matsuo, Nobutsugu Imanishi,