| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9818358 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2005 | 6 Pages |
Abstract
15 Indian coins have been analysed with energy dispersive X-ray fluorescence (EDXRF) and high energy particle induced X-ray emission (PIXE) techniques. A comparison of the analysis shows that the results obtained by these two techniques are in good agreement with each other.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
S. Santra, D. Mitra, M. Sarkar, D. Bhattacharya, A. Denker, J. Opitz-Coutureau, J. Rauschenberg,