| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9818465 | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | 2005 | 7 Pages |
Abstract
The proposed technique may open the new possibility for non-invasive bunch length measurements in the subpicosecond range.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
A.P. Potylitsyn,