Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9821483 | Vacuum | 2005 | 5 Pages |
Abstract
Measurements providing experimental evidence for linear interface shift and interface sharpening, as typical diffusion phenomena on a nanoscale, in different bi- or multilayer systems (Si/Ge, Cu/Ni, Mo/V) and results of computer simulations are presented on the basis of the research experience of our group. Special emphasis is given to sample preparation and measuring techniques capable of diffusion measurements on the nanoscale.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
D.L. Beke, Z. Erdélyi, G.A. Langer, A Csik, G.L. Katona,