| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9821491 | Vacuum | 2005 | 4 Pages |
Abstract
Time changes in refractive index and stress distribution across film thickness in the range from 10 to 106Â s and the effect of thermal annealing on thin As2S3 films deposited by thermal evaporation have been studied. A correlation between the refractive index and mechanical stress of the films has been found.
Related Topics
Physical Sciences and Engineering
Materials Science
Surfaces, Coatings and Films
Authors
N.D. Savchenko, T.N. Shchurova, N.Yu. Baran, A.A. Spesivykh,