The difference between the transverse and in-plane resistivity of vacuum evaporated cadmium sulfide (CdS) thin films

CdS films were prepared by vacuum evaporation. X-ray diffraction was used to analyze the crystal structure of CdS films. Only hexagonal phase with the preferred orientation of the (0 0 2) plane was found in CdS films. The in-plane and transverse resistivities were measured. The value of in-plane resistivities is in the range of 0.333-18.9Ωcm at room temperature. The value of transverse resistivities was about 8 orders more than that of in-plane resistivities. The relationship between the in-plane resistivity and the substrate temperature was different from that of the transverse resistivity and the substrate temperature. The in-plane resistivity of CdS films had a minimum at the substrate temperature of 150 °C, while the transverse resistivity of CdS films had the maximum at the substrate temperature of 150 °C.