Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9822506 | Applied Clay Science | 2005 | 9 Pages |
Abstract
New indexes on paper roughness at micro-scale are presented (RZI and SRI). In general, they show good correlation with sheet gloss. A new gloss index (SGI) is presented, accounting for the contribution of gloss from machine direction (MD) and cross direction (CD). Porosimetry was used to access microstructural characteristics in order to correlate them with light scattering and gloss properties. The former property is closely related to Hg intrusion volume of the coated layer while gloss is related to surface porosity with pore diameters in the range of 7-15 μm as measured by Hg intrusion volume.
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Authors
S. Conceição, N.F. Santos, J. Velho, J.M.F. Ferreira,