Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9829312 | Journal of Crystal Growth | 2005 | 6 Pages |
Abstract
ZnO:Zn phosphor thin films were prepared by face-to-face annealing at 450 °C in air. The effects of the face-to-face annealing on the structural and optical properties of the ZnO films were investigated by X-ray diffraction (XRD), photoluminescence (PL), optical transmittance and absorption measurements. Measurement results showed that the crystal quality of ZnO films was improved by face-to-face annealing. Both UV light emission and visible light emission were enhanced compared to those of open annealing films. The UV emission peak was observed to have a blueshift towards higher energy. The optical band-gap edge of as-annealed films shifted towards longer wavelength.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Ruijin Hong, Jianda Shao, Hongbo He, Zhengxiu Fan,