Article ID Journal Published Year Pages File Type
9829436 Journal of Crystal Growth 2005 4 Pages PDF
Abstract
AlGaN/GaN Schottky-barrier photodetectors with 7.5, 15, 30 and 60-nm-thick low temperature GaN cap layers were fabricated. It was found that dark currents were small for these detectors. With an incident light wavelength of 320 nm, it was found that measured peak responsivities were 0.07, 0.05 and 0.03 A/W while UV to visible rejection ratios were 700, 160 and 20 for the photodetectors with 15, 30 and 60-nm-thick low temperature GaN cap layers, respectively.
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Physical Sciences and Engineering Physics and Astronomy Condensed Matter Physics
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