Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9829505 | Journal of Crystal Growth | 2005 | 7 Pages |
Abstract
A unique growth manner for the formation of In(Ga)NAs film on GaAs (1Â 0Â 0) substrate is presented in this paper. The In(Ga)NAs compound alloy is significantly realized when a thin InN film is attempted to be overgrown on an InAs prelayers by metalorganic chemical vapor deposition (MOCVD). High-resolution X-ray diffraction (HRXRD) studies combined with the secondary-ion-mass spectrometry (SIMS) analysis substantially evidence that the interdiffusion of N and As atoms plays a decisive role in the thermodynamically preferable formation of In(Ga)NAs film, where the considerable amount of Ga atoms are revealed to be out-diffused from the substrate. The N composition in the In(Ga)NAs alloy up to 0.18 has been strikingly achieved using ammonia (NH3) as a source of nitrogen. Fourier-transform infrared spectroscopy (FTIR) transmittance measurements reveals that the optical absorption-edge shifted to lower energy with increasing N concentration. Detailed quantitative estimation on the band-gap energies of In(Ga)NAs films has been presented.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Fawang Yan, Yoshiki Naoi, Masashi Tsukihara, Takayuki Yadani, Shiro Sakai,