Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9829640 | Journal of Crystal Growth | 2005 | 5 Pages |
Abstract
Bi3.25Na2.25Ti3O12 thin films were prepared on p-Si(1Â 1Â 1) substrate by a metalorganic solution decomposition (MOSD) method. The structural characteristic and crystallization of the films were examined by X-ray diffraction. The current-voltage characteristic shows ohmic conductivity in the lower voltage range and space-charge-limited conductivity in the higher voltage range. The dielectric constant is 53 at a frequency of 100Â kHz at room temperature and the dissipation factor exists at a minimal value of 0.02 at a frequency of 200Â kHz. The retention time estimated by measuring capacitance is about 106Â s. Nonhysteretic C-V curves at various frequencies were also collected.
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Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Zh. Wang, Ch.H. Yang, X.Y. Yu, T. Yu,