| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9829903 | Journal of Crystal Growth | 2005 | 5 Pages |
Abstract
The resulting complex nanostructure is in contrast with rather rough surfaces in the range of 10Â nm as measured by atomic force microscopy, a strong c-axis texturation and a full epitaxy within the ab-plane as confirmed by four-circle X-ray diffraction. The local structure of the films was examined by high-resolution transmission electron microscopy (HRTEM) which allows determining the distribution of sizes of the domains. The results analysed using the theory of percolation show a 3D character of conductivity in the studied films.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
H.El. Alami, C. Deville Cavellin,