Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9829969 | Journal of Crystal Growth | 2005 | 6 Pages |
Abstract
High-quality Nd-doped gadolinium vanadate thin films on silica glass substrates were fabricated successfully by using a pulsed laser deposition technique. The properties of the samples were characterized by using X-ray diffraction, Rutherford backscattering, atomic force microscopy (AFM), and prism-coupling measurements. The RBS shows no obvious evidence for interdiffusion between the film and the substrate. The ratio of Gd/V in the film is 0.995. X-ray diffraction results show that the as-deposited Nd:GdVO4 film is basically oriented polycrystalline, and strong (2Â 0Â 0) peak was revealed. The refractive indices of the films determined with dark-mode prism coupling measurements are slightly smaller than that of the bulk crystal.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Hongxia Li, Jiyang Wang, Huaijin Zhang, Xiaoxia Wang, Guangwei Yu, Jianxiu Zhang, Liang Fang, Mingrong Shen, Jing Yang, Shiling Li, Xuelin Wang, Keming Wang,