Article ID Journal Published Year Pages File Type
9830059 Journal of Crystal Growth 2005 7 Pages PDF
Abstract
Thin films of antimony-doped tin oxide (SnO2:Sb) were prepared by spray pyrolysis using stannous chloride (SnCl2) and antimony trichloride (SbCl3) as precursors. The antimony doping was varied from 0 to 4 wt%. Scanning electron microscopy (SEM) revealed the surface morphology to be very smooth, yet grainy in nature. X-ray diffraction (XRD) shows films to have preferred orientation, which varies with the extent of antimony doping: undoped films prefer the (2 1 1) orientation, while the (3 0 1) orientation is preferred for doping levels of 0.5 and 1.0 wt%. For higher doping levels, the (2 0 0) orientation is preferred. This difference in preferred orientations is reflected in the SEM of the films. Atomic force microscopy (AFM) reveals that film roughness is not affected by antimony doping. The minimum sheet resistance (2.17 Ω/□) achieved in the present study is lower than values reported to date in SnO2:Sb films prepared from SnCl2 precursor. The Hall mobility of undoped SnO2 films was found to be 109.52 cm2/V s, which reduces to 2.55 cm2/V s for the films doped with 4 wt% of Sb. On the other hand, the carrier concentration, which is 1.23×1019 cm−3 in undoped films, increases to 2.89×1021 cm−3 for the films doped with 4 wt% of Sb.
Related Topics
Physical Sciences and Engineering Physics and Astronomy Condensed Matter Physics
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