Article ID Journal Published Year Pages File Type
9830202 Journal of Crystal Growth 2005 5 Pages PDF
Abstract
A detailed 3D simulation of a large-scale industrial cold-wall horizontal reactor for epitaxial silicon deposition is presented. Simulations showed that realistic inlet jets description is necessary to obtain a reliable picture of the system. Different chamber geometries are analyzed with the aim of reducing the “memory effects” during the dopant switching in junction production inside the same reactor chamber without wafers loading and unloading. Configurations inducing a graded gas expansion have been identified as contributing to the solution of the problem.
Related Topics
Physical Sciences and Engineering Physics and Astronomy Condensed Matter Physics
Authors
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