Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
9834615 | Journal of Magnetism and Magnetic Materials | 2005 | 6 Pages |
Abstract
The growth and interface roughness correlation in heteroepitaxial Fe/MgO/Fe3O4 junctions were investigated. The evidence of the correlation of layer interface roughness was found for the thickness of the MgO layer thinner than 0.95Â nm but not for the MgO layer thicker than 2Â nm. The change in the interface roughness correlation for the junction structure is thought to result from a change in the growth mode of the MgO layer. Our results suggest that the correlation of interface roughness may take a role on the thickness dependence of MgO insulating layer on the electrical properties of tunneling junctions.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Xuesong Jin, Ciaran McEvoy, I.V. Shvets,